The primary advantage of TEM is its exceptionally high resolution, often reaching sub-nanometer levels. This makes it possible to observe atomic arrangements and defects that are critical to the performance of nanomaterials. Additionally, TEM can be used in conjunction with other techniques like Electron Energy Loss Spectroscopy (EELS) and Energy-Dispersive X-ray Spectroscopy (EDS) to provide detailed information about the elemental composition and electronic structure of the specimen.
