Several imaging techniques have been developed to meet the needs of nanotechnology. Some of the most commonly used include:
Atomic Force Microscopy (AFM): This technique uses a mechanical probe to scan the surface of a sample, providing high-resolution topographical images. Scanning Electron Microscopy (SEM): SEM uses focused beams of electrons to create detailed images of the surface of a sample, revealing its morphology and composition. Transmission Electron Microscopy (TEM): TEM transmits electrons through a thin sample, allowing researchers to study the internal structure at atomic resolution. Scanning Tunneling Microscopy (STM): STM measures the tunneling current between a conductive tip and the sample surface, generating atomic-scale images. Fluorescence Microscopy: This technique uses fluorescent markers to visualize specific components within a sample, useful in studying biological nanostructures.
