detection and amplification techniques

What are Some Common Detection Techniques?

There are several detection techniques employed in nanotechnology, including:

Scanning Electron Microscopy (SEM): Uses focused beams of electrons to create detailed images of the surface structure of samples.
Transmission Electron Microscopy (TEM): Provides high-resolution images of the internal structure of nanomaterials.
Atomic Force Microscopy (AFM): Measures the force between a sharp probe and the surface of a sample to map its topography.
Fluorescence Spectroscopy: Detects fluorescent signals emitted by nanomaterials labeled with fluorophores.
Dynamic Light Scattering (DLS): Measures the size distribution of nanoparticles in a colloidal solution by analyzing the scattering of light.

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