What are Common Techniques Used in Nanomaterial Characterization?
[Scanning Electron Microscopy (SEM)](): SEM provides high-resolution images of the surface topography of nanomaterials. It is essential for examining the morphology and structure. [Transmission Electron Microscopy (TEM)](): TEM offers even higher resolution than SEM, allowing researchers to see the internal structure of nanomaterials at the atomic level. [Atomic Force Microscopy (AFM)](): AFM is used for surface characterization, measuring surface roughness, and understanding mechanical properties at the nanoscale. [X-ray Diffraction (XRD)](): XRD is used to determine the crystalline structure of nanomaterials, providing information about lattice parameters and phase composition. [Raman Spectroscopy](): This technique is used to study vibrational, rotational, and other low-frequency modes in nanomaterials, providing insights into molecular interactions and chemical composition.
