1. Instrumental Errors: These arise from the instruments used for measurement, such as scanning electron microscopes (SEM) or atomic force microscopes (AFM). Calibration issues, thermal drift, and electronic noise can contribute to these errors. 2. Environmental Factors: Temperature, humidity, and vibrations can affect nanoscale measurements. Even minor fluctuations can cause significant deviations. 3. Human Errors: Operator skill and experience can also introduce errors. Inconsistent sample preparation and handling can lead to variability in measurements. 4. Sample-related Issues: Sample preparation methods, such as coating and mounting, can introduce artifacts that affect the accuracy of measurements.
