Measuring non-linear I-V characteristics at the nanoscale involves using sophisticated techniques and equipment, including:
Scanning Tunneling Microscopy (STM): STM can provide detailed I-V characteristics by measuring the current as a function of the applied voltage at a very small scale. Atomic Force Microscopy (AFM): AFM-based techniques can also be used to map the I-V characteristics of nanomaterials. Conductive Atomic Force Microscopy (C-AFM): C-AFM combines the capabilities of AFM with electrical measurements to obtain I-V curves.
