Several techniques are employed to measure dielectric properties at the nanoscale:
Impedance Spectroscopy Impedance spectroscopy involves applying an AC voltage to a material and measuring the resulting current. This technique provides information about both the real and imaginary components of the dielectric constant, allowing for a comprehensive understanding of the material's behavior.
Scanning Probe Microscopy (SPM) Scanning probe microscopy techniques such as Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM) can measure dielectric properties at the nanoscale. These methods involve scanning a sharp tip over the material's surface and measuring the interaction between the tip and the sample.
Dielectric Relaxation Spectroscopy Dielectric relaxation spectroscopy measures the response of a material to an oscillating electric field over a range of frequencies. This technique helps in understanding the dynamics of charge carriers and dipoles within the material.
