For a nanotechnology process, the calculation of Cp and Cpk involves the following steps:
Determine the specification limits (USL and LSL). Collect a sample of process data. Calculate the process mean (μ) and standard deviation (σ). Compute Cp using the formula: \( Cp = \frac{USL - LSL}{6σ} \). Compute Cpk using the formulas: \( Cpk = \min \left( \frac{USL-μ}{3σ}, \frac{μ-LSL}{3σ} \right) \).
For a process to be considered capable, Cp and Cpk values should typically be greater than 1.33.
