Several techniques are used to measure the thickness of nanomaterials accurately:
- Atomic Force Microscopy (AFM): Utilizes a cantilever with a sharp tip to scan the surface and measure thickness at nanometer resolution. - Ellipsometry: Measures the change in polarization as light reflects or transmits through a material. - X-ray Reflectometry (XRR): Uses X-ray diffraction to measure surface and interface properties, including thickness.
