To measure dimensions at the nanoscale, advanced microscopy techniques are employed. [Scanning Electron Microscopy (SEM)]() and [Transmission Electron Microscopy (TEM)]() provide high-resolution images of nanoscale structures. [Atomic Force Microscopy (AFM)](), on the other hand, can measure surface topography at the atomic level. These tools are essential for characterizing and manipulating nanoscale materials with precision.
