internal structure

How is the Internal Structure Characterized?

Several sophisticated techniques are used to characterize the internal structure of nanomaterials:
Transmission Electron Microscopy (TEM): Provides high-resolution images of the internal structure.
Scanning Electron Microscopy (SEM): Offers detailed surface morphology and composition analysis.
X-ray Diffraction (XRD): Determines the crystalline structure and phase composition.
Atomic Force Microscopy (AFM): Measures surface roughness and topography.
Spectroscopy: Various spectroscopic methods (such as Raman and Infrared) provide information about chemical composition and molecular structure.

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