How is RHEED different from other surface analysis techniques?
RHEED is often compared with other surface analysis techniques like Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM). While STM and AFM provide atomic-level surface topography, RHEED offers complementary information about surface structure and dynamics during processes like film growth. Unlike STM and AFM, which require a tip to scan the surface, RHEED uses an electron beam, making it more suitable for real-time monitoring.
