Several techniques are employed to measure pressure in nanotechnology:
Scanning Probe Microscopy (SPM): Instruments like Atomic Force Microscopes (AFM) and Scanning Tunneling Microscopes (STM) can measure local pressure by monitoring the interaction forces between a probe tip and the sample surface. Nanoindentation: This technique measures the hardness and elastic modulus of materials by applying a controlled force with a sharp indenter and measuring the resulting indentation depth. Microelectromechanical Systems (MEMS): MEMS-based pressure sensors can be miniaturized for nanoscale applications, offering high sensitivity and precision. Optical Methods: Techniques like Raman spectroscopy and Brillouin scattering can be used to infer pressure by analyzing the shifts in vibrational spectra of materials under stress.
