Measuring material variability involves using advanced characterization techniques such as scanning electron microscopy (SEM), transmission electron microscopy (TEM), and atomic force microscopy (AFM). These techniques provide detailed information about the size, shape, composition, and surface structure of nanomaterials. Additionally, spectroscopic methods like Raman spectroscopy and X-ray diffraction (XRD) are used to study the chemical and crystallographic properties of nanomaterials.
