material heterogeneity

How is Material Heterogeneity Characterized?

Characterizing material heterogeneity requires advanced techniques that can probe the nanoscale. Some commonly used methods include:
Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) for imaging structural heterogeneity.
X-ray Diffraction (XRD) for identifying crystalline phases.
Energy Dispersive X-ray Spectroscopy (EDX) for compositional analysis.
Atomic Force Microscopy (AFM) for surface characterization.
Dynamic Light Scattering (DLS) for particle size distribution.

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