Precision in nanotechnology manufacturing is measured using various metrology techniques:
1. Scanning Electron Microscopy (SEM): SEM provides detailed images of the nanostructures, allowing for precise measurements. 2. Transmission Electron Microscopy (TEM): TEM offers high-resolution imaging of internal structures at the atomic level. 3. X-ray Diffraction (XRD): XRD is used to analyze the crystal structure and measure atomic spacing. 4. Spectroscopy: Techniques such as Raman spectroscopy and Fourier-transform infrared spectroscopy (FTIR) provide information on the molecular composition and structure.
