A variety of techniques and instruments are employed for in situ monitoring in nanotechnology. Some of the commonly used methods include:
Electron Microscopy: High-resolution imaging techniques like Transmission Electron Microscopy (TEM) and Scanning Electron Microscopy (SEM) are used to observe nanostructures in real-time. Spectroscopy: Techniques such as Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) provide information on the chemical composition and electronic states of nanomaterials. Atomic Force Microscopy (AFM): This tool measures the topography and mechanical properties of nanomaterials with atomic resolution. Synchrotron Radiation: Advanced light sources that offer high brightness and resolution for studying the structural and electronic properties of nanomaterials.
