Several techniques are used to measure the diameter of nanoscale materials, including Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM), and Atomic Force Microscopy (AFM). Each of these methods offers unique advantages. TEM can provide high-resolution images, while SEM offers ease of use for surface characterization. AFM, on the other hand, can measure the diameter of materials at the atomic level, offering extremely precise measurements.
