Measuring conductance at the nanoscale requires advanced techniques and tools:
Scanning Tunneling Microscopy (STM): STM can measure the conductance of individual atoms and molecules by using a sharp tip to scan the surface. Atomic Force Microscopy (AFM): AFM can be used to measure electrical properties by applying a voltage between the tip and the sample. Four-Probe Method: This technique involves using four separate probes to eliminate contact resistance, providing a more accurate measurement.
