Cluster analysis typically involves several steps, including data collection, selection of variables, choice of clustering method, and validation of results. In nanotechnology, data is often collected through various characterization techniques such as scanning electron microscopy (SEM), transmission electron microscopy (TEM), and X-ray diffraction (XRD). These techniques provide detailed information about the size, shape, and structure of nanomaterials. The selection of variables is crucial as it determines the basis for clustering. Commonly used variables include particle size, surface area, and zeta potential.
