How is Atomic Force Microscopy (AFM) Different from SEM and TEM?
AFM differs from SEM and TEM in that it does not use electrons but rather a mechanical probe to scan the sample surface. It measures the force between the probe and the sample to create topographical images. AFM can be used in various environments, including air, liquid, and vacuum, making it versatile for different types of samples. It is particularly useful for imaging soft materials like biological samples.
