In the nanotechnology field, XRF can be used to analyze nanomaterials and nanostructures. The process begins by bombarding the sample with primary X-rays, which causes the atoms in the nanomaterial to emit secondary X-rays. These emitted X-rays are then detected and analyzed to determine the sample's elemental composition. The precision of XRF makes it particularly useful for studying nanoparticles where even minute differences in composition can significantly impact performance.
