In SAXS, a beam of X-rays is directed at a sample. When these X-rays encounter inhomogeneities within the sample, such as different phases or particles, they are scattered at small angles. A detector positioned behind the sample collects the scattered X-rays. The intensity and pattern of the scattered X-rays are analyzed to infer the structural properties of the sample. The scattering angle is typically small, ranging from 0.1 to 5 degrees, allowing the technique to probe features ranging from 1 to 100 nanometers.
