Nano probing typically involves the use of specialized equipment, such as scanning probe microscopes (SPMs). These microscopes have extremely sharp tips that can be controlled with high precision to probe the surface of a material. The tips can measure various properties such as electrical conductivity, mechanical stiffness, and chemical composition at the nanoscale. Advanced techniques like Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM) are commonly used in nano probing.
