How Do Characterization Techniques Affect Interpretation?
Various characterization techniques, such as Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), and Atomic Force Microscopy (AFM), provide different types of information about nanomaterials. Each technique has its own limitations and strengths, and the data obtained may sometimes be contradictory. For instance, TEM might reveal detailed structural information, while AFM offers topographical data. Integrating these diverse datasets requires a deep understanding of each method's principles and limitations.
