Several techniques can be employed to detect microcracks in nanomaterials:
Scanning Electron Microscopy (SEM): Provides high-resolution images of the material's surface, allowing for the visualization of microcracks. Transmission Electron Microscopy (TEM): Offers detailed images of the internal structure of materials, helping to identify subsurface cracks. Atomic Force Microscopy (AFM): Measures surface topography at the nanoscale, useful for detecting surface microcracks. X-ray Diffraction (XRD): Provides information about the crystalline structure and can reveal the presence of internal stresses that may indicate microcracks.
