self assembled monolayers (sams)

How are SAMs Characterized?


The quality and properties of SAMs are typically characterized using various analytical techniques. Some of the common methods include:
Contact Angle Measurements: Used to assess the wettability and surface energy of the SAM-coated surface.
X-ray Photoelectron Spectroscopy (XPS): Provides information about the elemental composition and chemical states of the SAMs.
Fourier Transform Infrared Spectroscopy (FTIR): Used to identify the molecular functional groups and confirm the presence of the SAM.
Atomic Force Microscopy (AFM): Allows for the visualization and measurement of the SAM's surface topography at the nanoscale.

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