IV characteristics are typically measured using a source-measure unit (SMU) that can both apply a voltage and measure the resulting current, or vice versa. This is often done under controlled conditions to isolate the effects of temperature, light, and other environmental factors. Scanning Probe Microscopy techniques, such as Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM), are also employed to investigate the local electrical properties at the nanoscale.
