interfacial properties

How are Interfacial Properties Measured?

Several techniques are employed to measure and analyze interfacial properties at the nanoscale. These include:
Atomic Force Microscopy (AFM): Provides high-resolution imaging of surface topography.
Scanning Tunneling Microscopy (STM): Allows for the examination of surface electronic properties.
Contact Angle Measurement: Used to assess the wettability of surfaces.
X-ray Photoelectron Spectroscopy (XPS): Analyzes surface chemical composition.

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