interfaces and grain boundaries

How are Interfaces and Grain Boundaries Characterized?

Characterizing interfaces and grain boundaries is crucial for understanding their impact on material properties. Techniques such as transmission electron microscopy (TEM), scanning electron microscopy (SEM), and atomic force microscopy (AFM) are commonly used to observe and analyze these features at the nanoscale. Advanced spectroscopic methods like X-ray photoelectron spectroscopy (XPS) and electron energy loss spectroscopy (EELS) can provide information on the chemical composition and electronic structure of interfaces and grain boundaries.

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