Various techniques are employed to study grain boundaries in nanomaterials: - Transmission Electron Microscopy (TEM): Provides high-resolution images of grain boundaries, allowing for detailed structural analysis. - Scanning Electron Microscopy (SEM): Useful for examining the surface morphology and grain boundary distribution. - Atomic Force Microscopy (AFM): Offers topographical information and can measure the mechanical properties at grain boundaries. - X-ray Diffraction (XRD): Used to determine the orientation of grains and the presence of different phases.
