How are advances in microscopy aiding nanomaterial testing?
Advances in microscopy have been pivotal in the development of new testing methods. Techniques such as transmission electron microscopy (TEM) and scanning electron microscopy (SEM) allow for high-resolution imaging of nanomaterials, enabling detailed analysis of their morphology. Furthermore, atomic force microscopy (AFM) provides insights into the surface characteristics and mechanical properties of nanomaterials at the atomic level.
