Hallvard Angelskår - Nanotechnology

Author Information

Hallvard Angelskår is affiliated with SINTEF Digital, Dept. of Microsystems and Nanotechnology, Gaustadalléen 23C, 0373 Oslo, Norway. His research focuses on various aspects of nanotechnology and microsystems, with significant contributions to the field over the years.

Research Contributions

Hallvard Angelskår has made notable contributions to the fields of nanotechnology and microsystems. His research includes the study of waveguide backgrounds for on-chip nanoscopy, metasurface fabrication, and high-throughput large-area metalens fabrication. He has also explored efficient narrowband thermal emitters, low-loss ultrasound transmission, and advanced photoluminescence imaging-based characterization methods. His work spans various applications and technologies, reflecting a broad and impactful research portfolio.

Aliases

Hallvard Angelskår is also known by the aliases H. Angelskår and Hallvard Angelskar.

Publication and Citation Metrics

Metric	Value
Total Citations	162
h-index	8
Paper Count	17

Publications:

Study of waveguide background at visible wavelengths for on-chip nanoscopy.

DOI: 10.1364/OE.420844

Year: 2021

Metasurface Fabrication by Cryogenic and Bosch Deep Reactive Ion Etching

DOI: 10.3390/mi12050501

Year: 2021

Towards high-throughput large-area metalens fabrication using UV-nanoimprint lithography and Bosch deep reactive ion etching.

DOI: 10.1364/OE.393328

Year: 2020

Low-loss ultrasound transmission through glass assisted by resonance.

DOI: 10.1016/j.ultras.2019.01.011

Year: 2019

Design and simulation of efficient narrowband thermal emitter with 3 μm wavelength

DOI: 10.1364/CLEO_AT.2016.AW4K.6

Year: 2016

Characterization of the OSF-band structure in n-type Cz-Si using photoluminescence-imaging and visual inspection

DOI: 10.1016/J.JCRYSGRO.2012.12.148

Year: 2013

Direct monitoring of minority carrier density during light induced degradation in Czochralski silicon by photoluminescence imaging

DOI: 10.1063/1.4806999

Year: 2013

Advanced Photoluminescence Imaging-Based Characterization Methods

DOI: 10.4229/28THEUPVSEC2013-2CV.3.49

Year: 2013

Studying Light-Induced Degradation by Lifetime Decay Analysis: Excellent Fit to Solution of Simple Second-Order Rate Equation

DOI: 10.1109/JPHOTOV.2013.2278663

Year: 2013

Effect of Dislocations on the Electrical Response of Multicrystalline Silicon Solar Cells

DOI: 10.4229/28THEUPVSEC2013-2BO.4.4

Year: 2013

Why is Long Term Stability Important?

What are the Challenges in Using Bismuth Telluride Nanomaterials?

What are Zinc Oxide Nanowires?

What are the Challenges in International Protection?

What is a Particle in Nanotechnology?

How are Nanoscale Materials Created?

Can Nanotechnology Aid in the Search for Extraterrestrial Life?

What Is the Future of Nanotechnology in Automotive Coatings?

What is the Future of Rabi Oscillations in Nanotechnology?

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