Florian Vollnhals - Nanotechnology

Author Information

Florian Vollnhals is associated with the Institute for Nanotechnology and Correlative Microscopy (INAM), located at Äußere Nürnbergerstr. 62, 91301 Forchheim, Germany. His work primarily revolves around the field of nanotechnology, with a specific focus on microscopy techniques and the development of new methodologies for the analysis and fabrication of nanostructures.

Research Contributions

Florian Vollnhals has made significant contributions to the field of nanotechnology, particularly in the areas of electron-induced fabrication of metallic nanostructures, synthetic image rendering for deep learning applications in nanoparticle segmentation, and methodologies for analyzing nanomaterials using secondary ion mass spectrometry. His research extends to the study of bioactivity and corrosion behavior of magnesium barrier membranes, as well as the development of novel approaches for the fabrication of metallic nanostructures using focused soft X-ray beam induced deposition. Vollnhals has also explored the potential of correlative microscopy techniques and their applications in reconstructing 3D topographies combined with in situ analysis.

Aliases

The author is also known by the aliases F Vollnhals and Florian Vollnhals.

Publication and Citation Metrics

Metric	Value
Citation Count	489
h-index	13
Paper Count	34

Publications:

Synthetic Image Rendering Solves Annotation Problem in Deep Learning Nanoparticle Segmentation

DOI: 10.1002/SMTD.202100223

Year: 2021

Bioactivity and corrosion behavior of magnesium barrier membranes

DOI: 10.1002/maco.202112385

Year: 2021

Front Cover: Synthetic Image Rendering Solves Annotation Problem in Deep Learning Nanoparticle Segmentation (Small Methods 7/2021)

DOI: 10.1002/SMTD.202170028

Year: 2021

Controlled Electron-Induced Fabrication of Metallic Nanostructures on 1 nm Thick Membranes.

DOI: 10.1002/smll.202003947

Year: 2020

Microplastics and Nanoplastics : Analysis and Method Development Foreword : To Protect Water Quality Around the World

DOI:

Year: 2020

Secondary Ion Mass Spectrometry on the Helium Ion Microscope: methodologies for analysis of nanomaterials

DOI: 10.1017/S1431927618005573

Year: 2018

Focused Soft X-Ray Beam Induced Deposition: Recent Advances to a Novel Approach for Fabrication of Metallic Nanostructures

DOI: 10.1017/S1431927618012965

Year: 2018

Image Fusion in SIMS-based Correlative Microscopy: Methodology and Applications

DOI: 10.1017/S1431927618002519

Year: 2018

Correlative Microscopy in 3D: Helium Ion Microscopy-Based Photogrammetric Topography Reconstruction Combined with in situ Secondary Ion Mass Spectrometry.

DOI: 10.1021/acs.analchem.8b02530

Year: 2018

On the Principles of Tweaking Nanostructure Fabrication via Focused Electron Beam Induced Processing Combined with Catalytic Growth Processes

DOI: 10.1002/SMTD.201700095

Year: 2017

What is Secure Cloud Storage?

Are There Any Challenges Associated with Nanotechnology-Based Air Filters?

How are Scaffold Structures Fabricated?

What Are the Applications of Rapid Nucleation in Nanotechnology?

How Can Institutions Promote Talent Mobility?

Are There Any Challenges Associated with the Thermal Properties of Nanomaterials?

How Does Industry Experience Contribute?

What Are the Applications of Enhanced Thermal Conductivity?

How Can We Improve Communication in Nanotechnology?

How Does Nanotechnology Enable Controllable Adhesion?

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