How Does AFM Work?
The AFM operates by measuring the
force between a sharp probe, often called a
cantilever, and the surface of the sample. As the probe moves across the surface, it deflects. This deflection is monitored using a
laser beam that reflects off the back of the cantilever into a
photodetector. The resulting data is used to construct a topographic map of the surface.
Applications of AFM in Nanotechnology
AFM is a vital tool in the field of
nanotechnology for several reasons:
Advantages of Using AFM
AFM offers several advantages over other types of microscopy: High Resolution: It can achieve atomic resolution, which is much higher than that possible with optical microscopes.
Three-Dimensional Imaging: AFM provides detailed 3D images of the surface structure.
Versatility: It can be used on a wide variety of materials, including
insulators,
conductors, and
biological samples.
Limitations of AFM
Despite its numerous advantages, AFM has some limitations: Scan Size: The area that can be scanned is relatively small, typically in the range of micrometers.
Speed: AFM scanning can be slow, which may not be suitable for real-time analysis.
Damage to Samples: The probe can potentially damage soft or delicate samples.
